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Supervised by Ministry of Industry and Information Technology of The People's Republic of China Sponsored by Harbin Institute of Technology Editor-in-chief Yu Zhou ISSNISSN 1005-9113 CNCN 23-1378/T

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Related citation:Ying Li,Bo Wang,Xiang-Wei Kong,Yan-Qing Guo.Image Tampering Detection Using No-Reference Image Quality Metrics[J].Journal of Harbin Institute Of Technology(New Series),2014,21(6):51-56.DOI:10.11916/j.issn.1005-9113.2014.06.010.
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Image Tampering Detection Using No-Reference Image Quality Metrics
Author NameAffiliation
Ying Li School of Information and Communication Engineering, Dalian University of Technology, Dalian 116024, China 
Bo Wang School of Information and Communication Engineering, Dalian University of Technology, Dalian 116024, China 
Xiang-Wei Kong School of Information and Communication Engineering, Dalian University of Technology, Dalian 116024, China 
Yan-Qing Guo School of Information and Communication Engineering, Dalian University of Technology, Dalian 116024, China 
Abstract:
In this paper, a new approach is proposed to determine whether the content of an image is authentic or modified with a focus on detecting complex image tampering. Detecting image tampering without any prior information of the original image is a challenging problem since unknown diverse manipulations may have different characteristics and so do various formats of images. Our principle is that image processing, no matter how complex, may affect image quality, so image quality metrics can be used to distinguish tampered images. In particular, based on the alteration of image quality in modified blocks, the proposed method can locate the tampered areas. Referring to four types of effective no-reference image quality metrics, we obtain 13 features to present an image. The experimental results show that the proposed method is very promising on detecting image tampering and locating the locally tampered areas especially in realistic scenarios.
Key words:  image forensics  tampering detection  no-reference  image quality metrics  tampering localization
DOI:10.11916/j.issn.1005-9113.2014.06.010
Clc Number:TP391.7
Fund:

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