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Supervised by Ministry of Industry and Information Technology of The People's Republic of China Sponsored by Harbin Institute of Technology Editor-in-chief Yu Zhou ISSNISSN 1005-9113 CNCN 23-1378/T

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Related citation:Vitaly Neshchimenko,Chundong Li,Mikhail Mikhailov,Jinpeng Lv.Size Effect on the Radiation Stability Silicon Dioxide Sphere Particles[J].Journal of Harbin Institute Of Technology(New Series),2024,31(4):1-12.DOI:10.11916/j.issn.1005-9113.2023077.
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Size Effect on the Radiation Stability Silicon Dioxide Sphere Particles
Author NameAffiliation
Vitaly Neshchimenko Laboratory of Radiation Stability Evaluation of Thermal Control Coatings, Amur State University, Blagoveshchensk 675000, Russia 
Chundong Li Science and Technology on Material Performance Evaluating in Space Environment Laboratory, Harbin Institute of Technology, Harbin 150001, China 
Mikhail Mikhailov Radiation and Space Materials Laboratory, Tomsk State University of Control Systems and Radio-Electronics, Tomsk 634050, Russia 
Jinpeng Lv Department of Material Science and Technology, Nanjing University of Aeronautics & Astronautics, Nanjing 210016, China 
Abstract:
The effect of protons (E = 100 keV, F = 5×1015 cm-2) exposure on the diffuse reflectance spectra of the SiO2 with different size particles in wavelength range from 250 to 2500 nm have been investigated. Particles were nanosphere, submicrosphere, microsphere and submacrosphere, as well as solid micro- and nanocrystals. The synthesis of the particles was carried out by the formation of silica shells and dissolution of the polystyrene core particles. The surface morphology, surface area and crystal structure of the particles have been investigated. When evaluating the changes of the solar absorptance, it was found that the radiation stability of the micro- and submacro-hollow particles is higher than that of the other nanostructured particles, except for solid microcrystals. The low radiation stability of the hollow microparticles is due to the large void inside the hollow particles where radiation defects are not formed.
Key words:  silicon dioxide  hollow particles  spectral reflectance  irradiation
DOI:10.11916/j.issn.1005-9113.2023077
Clc Number:V254.2, TB34
Fund:

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