| 引用本文: | 蔡金燕,张峻宾,孟亚峰.基于改进二分查找的VRC快速故障定位技术[J].哈尔滨工业大学学报,2017,49(11):151.DOI:10.11918/j.issn.0367-6234.201612042 |
| CAI Jinyan,ZHANG Junbin,MENG Yafeng.Rapid fault localization technology of VRC based on improved binary search[J].Journal of Harbin Institute of Technology,2017,49(11):151.DOI:10.11918/j.issn.0367-6234.201612042 |
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| 摘要: |
| 针对虚拟可重构电路(virtual reconfigurable circuits, VRC)故障定位难、传统故障定位方法测试次数大等问题，提出一种基于改进二分查找的VRC快速故障定位技术.当VRC规模不大于两行(或两列)时，直接逐行(逐列)定位故障.当VRC规模大于两行和两列时，首先执行一次行测试和一次列测试，以确定可编程单元(programmable elements, PE)的故障可疑区域；然后比较故障可疑区域的行/列数量，以数量较少的作为故障测试方向；最后在测试方向上二分故障可疑区域，根据行/列测试原理配置电路并执行“与”操作，根据输出结果定位故障.当故障可疑区域无法二分时，可定位所有故障PE.故障定位性能分析表明：和常规的VRC故障定位技术相比，本文提出的VRC快速故障定位技术能够快速检测并隔离连续分布的无故障PE，快速缩小测试区域，大幅度降低故障定位测试次数，且出现最大测试次数的概率远小于前者，单故障和双故障定位的平均测试次数缩减量超过50%.基于改进二分查找的VRC快速故障定位技术的可行性和有效性得到验证，具有一定的通用性和工程应用价值.
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| 关键词: 硬件演化 故障定位 虚拟可重构电路 可编程单元 二分查找 |
| DOI：10.11918/j.issn.0367-6234.201612042 |
| 分类号:TP302.8 |
| 文献标识码:A |
| 基金项目:国家自然科学基金(9,5) |
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| Rapid fault localization technology of VRC based on improved binary search |
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CAI Jinyan1,ZHANG Junbin1,2,MENG Yafeng1
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(1. Department of Electronic and Optical Engineering, Ordnance Engineering College, Shijiazhuang 050003, China; 2. China Aerodynamics Research & Development Center, Hypervelocity Aerodynamics Institute, Mianyang 621000, China)
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| Abstract: |
| According to difficult fault localization of virtual reconfigurable circuits (VRC) and large test times of traditional fault localization technology, a novel rapid fault localization technology of VRC based on improved binary search is proposed. When the scales of VRC are no more than two rows (or two columns), fault PE can be located line by line (or column by column). When the scales of VRC are larger than two rows and two columns, the fault dubitable area of programmable elements (PE) can be confirmed by one row-test and one column-test, and then the test direction can be confirmed through the number of rows and columns of fault dubitable area. Eventually, fault dubitable area can be divided equally in the test direction, and two parts can be configured based on the theory of row-test and column-test. Faults can be located by "AND" operation of two parts. All faults PE can be located until fault dubitable area can not divided two parts. Compared with traditional VRC fault localization technology, the test performance analysis of fault localization proves that continuous distribution trouble-free PE can be detected and isolated by proposed VRC fault localization technology, and test area can be narrowed quickly. The test number of faults localization can be reduced, and the maximum test numbers are smaller than former. The average decrement of single and dual fault localization test number is more than 50%. The feasibility and validity of proposed improved rapid fault localization technology are proved, and it has definite generality and engineering application value.
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| Key words: evolvable hardware (EHW) fault localization virtual reconfigurable circuits(VRC) programmable elements(PE) binary search |
